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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/KawashimaHY15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ichiro_Yamakawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takashi_Hashimoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoshiyuki_Kawashima>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS.2015.7112809>
foaf:homepage <https://doi.org/10.1109/IRPS.2015.7112809>
dc:identifier DBLP conf/irps/KawashimaHY15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS.2015.7112809 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label Investigation of the data retention mechanism and modeling for the high reliability embedded split-gate MONOS flash memory. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ichiro_Yamakawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takashi_Hashimoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoshiyuki_Kawashima>
swrc:pages 6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2015>
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/KawashimaHY15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2015.html#KawashimaHY15>
rdfs:seeAlso <https://doi.org/10.1109/IRPS.2015.7112809>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Investigation of the data retention mechanism and modeling for the high reliability embedded split-gate MONOS flash memory. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document