[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/KimPCKKSCJ23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dahyub_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eunyu_Choi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hyerim_Park>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hyewon_Shim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Paul_Jung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seongkyung_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shin-Young_Chung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Young_Han_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10117953>
foaf:homepage <https://doi.org/10.1109/IRPS48203.2023.10117953>
dc:identifier DBLP conf/irps/KimPCKKSCJ23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48203.2023.10117953 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Reliability Assessment of 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dahyub_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eunyu_Choi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hyerim_Park>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hyewon_Shim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Paul_Jung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seongkyung_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shin-Young_Chung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Young_Han_Kim>
swrc:pages 1-8 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/KimPCKKSCJ23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/KimPCKKSCJ23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2023.html#KimPCKKSCJ23>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48203.2023.10117953>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Reliability Assessment of 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document