Finding Suitable Gate Insulators for Reliable 2D FETs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/irps/KnoblochIG22
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/irps/KnoblochIG22
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Theresia_Knobloch
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tibor_Grasser
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yury_Yu._Illarionov
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FIRPS48227.2022.9764499
>
foaf:
homepage
<
https://doi.org/10.1109/IRPS48227.2022.9764499
>
dc:
identifier
DBLP conf/irps/KnoblochIG22
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FIRPS48227.2022.9764499
(xsd:string)
dcterms:
issued
2022
(xsd:gYear)
rdfs:
label
Finding Suitable Gate Insulators for Reliable 2D FETs.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Theresia_Knobloch
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tibor_Grasser
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yury_Yu._Illarionov
>
swrc:
pages
2
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/irps/2022
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/irps/KnoblochIG22/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/irps/KnoblochIG22
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/irps/irps2022.html#KnoblochIG22
>
rdfs:
seeAlso
<
https://doi.org/10.1109/IRPS48227.2022.9764499
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/irps
>
dc:
title
Finding Suitable Gate Insulators for Reliable 2D FETs.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document