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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/KranthiKSBS20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Akram_A._Salman>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Boeila_Sampath_Kumar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gianluca_Boselli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mayank_Shrivastava>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nagothu_Karmel_Kranthi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS45951.2020.9129624>
foaf:homepage <https://doi.org/10.1109/IRPS45951.2020.9129624>
dc:identifier DBLP conf/irps/KranthiKSBS20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS45951.2020.9129624 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Akram_A._Salman>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Boeila_Sampath_Kumar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gianluca_Boselli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mayank_Shrivastava>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nagothu_Karmel_Kranthi>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/KranthiKSBS20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/KranthiKSBS20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2020.html#KranthiKSBS20>
rdfs:seeAlso <https://doi.org/10.1109/IRPS45951.2020.9129624>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document