Localized thermal effects in Gate-all-around devices.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/irps/LandonJPMKHS23
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/irps/LandonJPMKHS23
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Colin_Landon
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Daniel_Pantuso
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Daniel_Schroeder
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Inanc_Meric
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jeffrey_Hicks
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kam_Komeyli
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Lei_Jiang
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10117903
>
foaf:
homepage
<
https://doi.org/10.1109/IRPS48203.2023.10117903
>
dc:
identifier
DBLP conf/irps/LandonJPMKHS23
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FIRPS48203.2023.10117903
(xsd:string)
dcterms:
issued
2023
(xsd:gYear)
rdfs:
label
Localized thermal effects in Gate-all-around devices.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Colin_Landon
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Daniel_Pantuso
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Daniel_Schroeder
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Inanc_Meric
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jeffrey_Hicks
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kam_Komeyli
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Lei_Jiang
>
swrc:
pages
1-5
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/irps/2023
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/irps/LandonJPMKHS23/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/irps/LandonJPMKHS23
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/irps/irps2023.html#LandonJPMKHS23
>
rdfs:
seeAlso
<
https://doi.org/10.1109/IRPS48203.2023.10117903
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/irps
>
dc:
title
Localized thermal effects in Gate-all-around devices.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document