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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/LeurquinVGMDIMC23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Constant>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/B._Mohamad>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Camille_Leurquin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ferdinando_Iucolano>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/G._Despesse>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Roberto_Modica>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Romain_Gwoziecki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/William_Vandendaele>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10117813>
foaf:homepage <https://doi.org/10.1109/IRPS48203.2023.10117813>
dc:identifier DBLP conf/irps/LeurquinVGMDIMC23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48203.2023.10117813 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Drain voltage impact on charge redistribution in GaN-on-Si E-mode MOSc-HEMTs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Constant>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/B._Mohamad>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Camille_Leurquin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ferdinando_Iucolano>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/G._Despesse>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Roberto_Modica>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Romain_Gwoziecki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/William_Vandendaele>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/LeurquinVGMDIMC23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/LeurquinVGMDIMC23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2023.html#LeurquinVGMDIMC23>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48203.2023.10117813>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Drain voltage impact on charge redistribution in GaN-on-Si E-mode MOSc-HEMTs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document