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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/LeurquinVVGESDI22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Constant>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Aby-Ga%E2%88%9A%C4%99l_Viey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Camille_Leurquin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ferdinando_Iucolano>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/G._Despesse>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._Salot>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ren%E2%88%9A%C2%A9_Escoffier>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Roberto_Modica>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Romain_Gwoziecki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/William_Vandendaele>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48227.2022.9764482>
foaf:homepage <https://doi.org/10.1109/IRPS48227.2022.9764482>
dc:identifier DBLP conf/irps/LeurquinVVGESDI22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48227.2022.9764482 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Novel High Voltage Bias Temperature Instabilities (HV-BTI) setup to monitor RON/VTH drift on GaN-on-Si E-mode MOSc-HEMTs under drain voltage. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Constant>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Aby-Ga%E2%88%9A%C4%99l_Viey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Camille_Leurquin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ferdinando_Iucolano>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/G._Despesse>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._Salot>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ren%E2%88%9A%C2%A9_Escoffier>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Roberto_Modica>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Romain_Gwoziecki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/William_Vandendaele>
swrc:pages 10 (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2022.html#LeurquinVVGESDI22>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48227.2022.9764482>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Novel High Voltage Bias Temperature Instabilities (HV-BTI) setup to monitor RON/VTH drift on GaN-on-Si E-mode MOSc-HEMTs under drain voltage. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document