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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/LiWDHDL18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gang_Du>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/K._L._Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peng_Huang_0004>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shaoyan_Di>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiao-Yan_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yun_Li>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS.2018.8353702>
foaf:homepage <https://doi.org/10.1109/IRPS.2018.8353702>
dc:identifier DBLP conf/irps/LiWDHDL18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS.2018.8353702 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label PBTI evaluation of In0.65Ga0.35As/In0.53Ga0.47As nanowire FETs with Al2O3 and LaAlO3 gate dielectrics. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gang_Du>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/K._L._Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peng_Huang_0004>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shaoyan_Di>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiao-Yan_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yun_Li>
swrc:pages 7-1 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/LiWDHDL18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/LiWDHDL18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2018.html#LiWDHDL18>
rdfs:seeAlso <https://doi.org/10.1109/IRPS.2018.8353702>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title PBTI evaluation of In0.65Ga0.35As/In0.53Ga0.47As nanowire FETs with Al2O3 and LaAlO3 gate dielectrics. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document