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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/LiZNMLLJMG20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alain_Loiseau>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anindya_Nath>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Baofu_Zhu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeffrey_B._Johnson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Meng_Miao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_Gauthier_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Souvick_Mitra>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/You_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhiqing_Li>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS45951.2020.9128351>
foaf:homepage <https://doi.org/10.1109/IRPS45951.2020.9128351>
dc:identifier DBLP conf/irps/LiZNMLLJMG20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS45951.2020.9128351 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive TCAD Simulation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alain_Loiseau>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anindya_Nath>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Baofu_Zhu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeffrey_B._Johnson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Meng_Miao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_Gauthier_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Souvick_Mitra>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/You_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhiqing_Li>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/LiZNMLLJMG20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/LiZNMLLJMG20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2020.html#LiZNMLLJMG20>
rdfs:seeAlso <https://doi.org/10.1109/IRPS45951.2020.9128351>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive TCAD Simulation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document