A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/irps/MahajanCAVKR22
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/irps/MahajanCAVKR22
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Bikram_Kishore_Mahajan
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Dhanoop_Varghese
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Muhammad_Ashraful_Alam
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Srikanth_Krishnan
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Vijay_Reddy
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yen-Pu_Chen
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FIRPS48227.2022.9764435
>
foaf:
homepage
<
https://doi.org/10.1109/IRPS48227.2022.9764435
>
dc:
identifier
DBLP conf/irps/MahajanCAVKR22
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FIRPS48227.2022.9764435
(xsd:string)
dcterms:
issued
2022
(xsd:gYear)
rdfs:
label
A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Bikram_Kishore_Mahajan
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Dhanoop_Varghese
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Muhammad_Ashraful_Alam
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Srikanth_Krishnan
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Vijay_Reddy
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yen-Pu_Chen
>
swrc:
pages
10
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/irps/2022
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/irps/MahajanCAVKR22/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/irps/MahajanCAVKR22
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/irps/irps2022.html#MahajanCAVKR22
>
rdfs:
seeAlso
<
https://doi.org/10.1109/IRPS48227.2022.9764435
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/irps
>
dc:
title
A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document