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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/MahmudGTMJSZRCM19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Zainuddin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Amit_Gupta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Byoung_Min>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._Johnson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Iqbal_Mahmud>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Maria_Toledano-Luque>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/N._Rao_Mavilla>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/P._Srinivasan_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Rao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Salvatore_Cimino>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tanya_Nigam>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS.2019.8720535>
foaf:homepage <https://doi.org/10.1109/IRPS.2019.8720535>
dc:identifier DBLP conf/irps/MahmudGTMJSZRCM19 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS.2019.8720535 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
rdfs:label Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Zainuddin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Amit_Gupta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Byoung_Min>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._Johnson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Iqbal_Mahmud>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Maria_Toledano-Luque>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/N._Rao_Mavilla>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/P._Srinivasan_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Rao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Salvatore_Cimino>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tanya_Nigam>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2019>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/MahmudGTMJSZRCM19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/MahmudGTMJSZRCM19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2019.html#MahmudGTMJSZRCM19>
rdfs:seeAlso <https://doi.org/10.1109/IRPS.2019.8720535>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document