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foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10117793>
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dc:identifier DBLP conf/irps/MalikJCMKSBVS23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48203.2023.10117793 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Signatures of Positive Gate Over-Drive Induced Hole Trap Generation and its Impact on p-GaN Gate Stack Instability in AlGaN/GaN HEMTs. (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/IRPS48203.2023.10117793>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Signatures of Positive Gate Over-Drive Induced Hole Trap Generation and its Impact on p-GaN Gate Stack Instability in AlGaN/GaN HEMTs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document