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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/MirJCMMS23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mayank_Shrivastava>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mehak_Ashraf_Mir>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohammad_Ateeb_Munshi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rajarshi_Roy_Chaudhuri>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rasik_Rashid_Malik>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vipin_Joshi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10117664>
foaf:homepage <https://doi.org/10.1109/IRPS48203.2023.10117664>
dc:identifier DBLP conf/irps/MirJCMMS23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48203.2023.10117664 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Dynamic Interplay of Surface and Buffer Traps in Determining Drain Current Injection induced Device Instability in OFF-state of AlGaN/GaN HEMTs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mayank_Shrivastava>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mehak_Ashraf_Mir>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohammad_Ateeb_Munshi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rajarshi_Roy_Chaudhuri>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rasik_Rashid_Malik>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vipin_Joshi>
swrc:pages 1-6 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/IRPS48203.2023.10117664>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Dynamic Interplay of Surface and Buffer Traps in Determining Drain Current Injection induced Device Instability in OFF-state of AlGaN/GaN HEMTs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document