Analysis of charge-to-hot-carrier degradation in Ge pFinFETs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/irps/MizubayashiOFIE20
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Analysis of charge-to-hot-carrier degradation in Ge pFinFETs.
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Analysis of charge-to-hot-carrier degradation in Ge pFinFETs.
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