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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/MizubayashiOFIE20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Oka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazuhiko_Endo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koichi_Fukuda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wataru_Mizubayashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuki_Ishikawa>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS45951.2020.9129279>
foaf:homepage <https://doi.org/10.1109/IRPS45951.2020.9129279>
dc:identifier DBLP conf/irps/MizubayashiOFIE20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS45951.2020.9129279 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Analysis of charge-to-hot-carrier degradation in Ge pFinFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Oka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazuhiko_Endo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koichi_Fukuda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wataru_Mizubayashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuki_Ishikawa>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2020>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2020.html#MizubayashiOFIE20>
rdfs:seeAlso <https://doi.org/10.1109/IRPS45951.2020.9129279>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Analysis of charge-to-hot-carrier degradation in Ge pFinFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document