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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/ModoloSMSSPMZM22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andrea_Minetto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Carlo_De_Santi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Enrico_Zanoni>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gaudenzio_Meneghesso>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gerhard_Prechtl>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Luca_Sayadi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matteo_Meneghini>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nicola_Modolo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sebastien_Sicre>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48227.2022.9764414>
foaf:homepage <https://doi.org/10.1109/IRPS48227.2022.9764414>
dc:identifier DBLP conf/irps/ModoloSMSSPMZM22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48227.2022.9764414 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Modeling Hot-Electron Trapping in GaN-based HEMTs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andrea_Minetto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Carlo_De_Santi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Enrico_Zanoni>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gaudenzio_Meneghesso>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gerhard_Prechtl>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Luca_Sayadi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matteo_Meneghini>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nicola_Modolo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sebastien_Sicre>
swrc:pages 10 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/ModoloSMSSPMZM22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/ModoloSMSSPMZM22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2022.html#ModoloSMSSPMZM22>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48227.2022.9764414>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Modeling Hot-Electron Trapping in GaN-based HEMTs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document