Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/irps/MukherjeeSMZMYG20
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Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors.
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