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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/NaikLYKBCKHCCHP22>
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dc:creator <https://dblp.l3s.de/d2r/resource/authors/N._L._Chung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nivetha_Balasankaran>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Oliver_Kallensee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._Chao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._K_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Y._Siah>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Steven_Soss>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Suk_Hee_Jang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/T._H._Chan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/T._Ling>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_Merbeth>
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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wah-Peng_Neo>
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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Y._S._You>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuichi_Otani>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48227.2022.9764563>
foaf:homepage <https://doi.org/10.1109/IRPS48227.2022.9764563>
dc:identifier DBLP conf/irps/NaikLYKBCKHCCHP22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48227.2022.9764563 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities. (xsd:string)
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chim_Seng_Seet>
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._H._Lim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._Kwon>
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._Chao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._K_0001>
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Steven_Soss>
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vinayak_Bharat_Naik>
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Y._S._You>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuichi_Otani>
swrc:pages 6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2022>
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rdfs:seeAlso <https://doi.org/10.1109/IRPS48227.2022.9764563>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document