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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/NarasimhamCSTBB21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Balaji_Narasimham>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bharat_L._Bhuva>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dennis_R._Ball>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Liming_Tsau>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mike_Smith>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vikas_Chaudhary>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS46558.2021.9405216>
foaf:homepage <https://doi.org/10.1109/IRPS46558.2021.9405216>
dc:identifier DBLP conf/irps/NarasimhamCSTBB21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS46558.2021.9405216 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Balaji_Narasimham>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bharat_L._Bhuva>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dennis_R._Ball>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Liming_Tsau>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mike_Smith>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vikas_Chaudhary>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2021>
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rdfs:seeAlso <https://doi.org/10.1109/IRPS46558.2021.9405216>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document