[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/NaritaKISMYKTKKUKSNIWKO23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daigo_Kikuta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroki_Watanabe>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jun_Kojima>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jun_Suda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazuyoshi_Tomita>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kenji_Ito>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masakazu_Kanechika>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masayoshi_Kosaki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Satoshi_Ikeda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Satoshi_Yamaguchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Kondo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tetsuo_Narita>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tohru_Oka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomohiko_Mori>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomoyuki_Shoji>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsutomu_Uesugi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yasuji_Kimoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoshitaka_Nagasato>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10118047>
foaf:homepage <https://doi.org/10.1109/IRPS48203.2023.10118047>
dc:identifier DBLP conf/irps/NaritaKISMYKTKKUKSNIWKO23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48203.2023.10118047 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Reliability issues of gate oxides and $p-n$ junctions for vertical GaN metal-oxide-semiconductor field-effect transistors (Invited). (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daigo_Kikuta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroki_Watanabe>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jun_Kojima>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jun_Suda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazuyoshi_Tomita>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kenji_Ito>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masakazu_Kanechika>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masayoshi_Kosaki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Satoshi_Ikeda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Satoshi_Yamaguchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Kondo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tetsuo_Narita>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tohru_Oka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomohiko_Mori>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomoyuki_Shoji>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsutomu_Uesugi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yasuji_Kimoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoshitaka_Nagasato>
swrc:pages 1-10 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/NaritaKISMYKTKKUKSNIWKO23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/NaritaKISMYKTKKUKSNIWKO23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2023.html#NaritaKISMYKTKKUKSNIWKO23>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48203.2023.10118047>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Reliability issues of gate oxides and $p-n$ junctions for vertical GaN metal-oxide-semiconductor field-effect transistors (Invited). (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document