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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/NovakPBLACPNRN15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._Parker>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/D._Becher>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Chahal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marty_Agostinelli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/P._Nayak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/P._Packan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Natarajan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stephen_Ramey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Steven_R._Novak>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS.2015.7112692>
foaf:homepage <https://doi.org/10.1109/IRPS.2015.7112692>
dc:identifier DBLP conf/irps/NovakPBLACPNRN15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS.2015.7112692 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label Transistor aging and reliability in 14nm tri-gate technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._Parker>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/D._Becher>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Chahal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marty_Agostinelli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/P._Nayak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/P._Packan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Natarajan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stephen_Ramey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Steven_R._Novak>
swrc:pages 2 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2015>
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/NovakPBLACPNRN15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2015.html#NovakPBLACPNRN15>
rdfs:seeAlso <https://doi.org/10.1109/IRPS.2015.7112692>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Transistor aging and reliability in 14nm tri-gate technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document