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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/OngLO18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._S._Oates>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shou-Chung_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yi_Ching_Ong>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS.2018.8353667>
foaf:homepage <https://doi.org/10.1109/IRPS.2018.8353667>
dc:identifier DBLP conf/irps/OngLO18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS.2018.8353667 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Percolation defect nucleation and growth as a description of the statistics of electrical breakdown for gate, MOL and BEOL dielectrics. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._S._Oates>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shou-Chung_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yi_Ching_Ong>
swrc:pages 7-1 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/OngLO18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/OngLO18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2018.html#OngLO18>
rdfs:seeAlso <https://doi.org/10.1109/IRPS.2018.8353667>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Percolation defect nucleation and growth as a description of the statistics of electrical breakdown for gate, MOL and BEOL dielectrics. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document