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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/PaliwodaCKSM18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Kerber>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/D._Singh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Durga_Misra>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peter_C._Paliwoda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zakariae_Chbili>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS.2018.8353640>
foaf:homepage <https://doi.org/10.1109/IRPS.2018.8353640>
dc:identifier DBLP conf/irps/PaliwodaCKSM18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS.2018.8353640 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Ambient temperature and layout impact on self-heating characterization in FinFET devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Kerber>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/D._Singh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Durga_Misra>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peter_C._Paliwoda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zakariae_Chbili>
swrc:pages 6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/PaliwodaCKSM18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/PaliwodaCKSM18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2018.html#PaliwodaCKSM18>
rdfs:seeAlso <https://doi.org/10.1109/IRPS.2018.8353640>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Ambient temperature and layout impact on self-heating characterization in FinFET devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document