Effects of front-end-of line process variations and defects on retention failure of flash memory: Charge loss/gain mechanism.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/irps/ParkLKKCILCPSP15
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Effects of front-end-of line process variations and defects on retention failure of flash memory: Charge loss/gain mechanism.
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