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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/PirroLBKHZJEGOZ22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alban_Zaka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._Brantz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/E._Ebrand>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._Herzog>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jan_Hoentschel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/K._Gebauer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Luca_Pirro>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Kessler>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Otto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Olaf_Zimmerhackl>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/P._Liebscher>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._Jain>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48227.2022.9764532>
foaf:homepage <https://doi.org/10.1109/IRPS48227.2022.9764532>
dc:identifier DBLP conf/irps/PirroLBKHZJEGOZ22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48227.2022.9764532 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alban_Zaka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._Brantz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/E._Ebrand>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._Herzog>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jan_Hoentschel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/K._Gebauer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Luca_Pirro>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Kessler>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Otto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Olaf_Zimmerhackl>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/P._Liebscher>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._Jain>
swrc:pages 59-1 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/PirroLBKHZJEGOZ22/dblp>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2022.html#PirroLBKHZJEGOZ22>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48227.2022.9764532>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document