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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/ReganazDRLCNBPMA23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alessandro_Bricalli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Damien_Deleruyelle>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fran%E2%88%9A%C3%9Fois_Andrieu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gabriel_Molas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giuseppe_Piccolboni>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jean-Fran%E2%88%9A%C3%9Fois_Nodin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joel_Minguet_Lopez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lucas_Reganaz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Niccolo_Castellani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Quentin_Rafhay>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10117882>
foaf:homepage <https://doi.org/10.1109/IRPS48203.2023.10117882>
dc:identifier DBLP conf/irps/ReganazDRLCNBPMA23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48203.2023.10117882 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Investigation of resistance fluctuations in ReRAM: physical origin, temporal dependence and impact on memory reliability. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alessandro_Bricalli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Damien_Deleruyelle>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fran%E2%88%9A%C3%9Fois_Andrieu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gabriel_Molas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giuseppe_Piccolboni>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jean-Fran%E2%88%9A%C3%9Fois_Nodin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joel_Minguet_Lopez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lucas_Reganaz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Niccolo_Castellani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Quentin_Rafhay>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/ReganazDRLCNBPMA23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/ReganazDRLCNBPMA23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2023.html#ReganazDRLCNBPMA23>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48203.2023.10117882>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Investigation of resistance fluctuations in ReRAM: physical origin, temporal dependence and impact on memory reliability. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document