ESD Avalanche Diodes Degradation in EOS Regime. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Hossein_Sarbishaei>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Vladislav_A._Vashchenko>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10118321>
foaf:homepage	<https://doi.org/10.1109/IRPS48203.2023.10118321>
dc:identifier	DBLP conf/irps/SarbishaeiV23 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FIRPS48203.2023.10118321 (xsd:string)
dcterms:issued	2023 (xsd:gYear)
rdfs:label	ESD Avalanche Diodes Degradation in EOS Regime. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Hossein_Sarbishaei>
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owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/irps/SarbishaeiV23>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/irps/irps2023.html#SarbishaeiV23>
rdfs:seeAlso	<https://doi.org/10.1109/IRPS48203.2023.10118321>
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dc:title	ESD Avalanche Diodes Degradation in EOS Regime. (xsd:string)
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rdf:type	swrc:InProceedings
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