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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/SatoSJLBKRLHJLKLLPSJSKK23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/B._I._Seo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/D._S._Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._Bae>
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dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._Jung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._Kwon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._M._Shin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideo_Sato>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._H._Jeong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._H._Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._H._Park>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._M._Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._W._Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/K._H._Ryu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/K._Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._W._Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/W._C._Lim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Y._J._Song>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Y._Ji>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Y._S._Han>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10118152>
foaf:homepage <https://doi.org/10.1109/IRPS48203.2023.10118152>
dc:identifier DBLP conf/irps/SatoSJLBKRLHJLKLLPSJSKK23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48203.2023.10118152 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Comprehensive study on prediction of endurance properties from breakdown voltage in high-reliable STT-MRAM. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/B._I._Seo>
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._Bae>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._H._Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._Jung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._Kwon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._M._Shin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideo_Sato>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._H._Jeong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._H._Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._H._Park>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._M._Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._W._Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/K._H._Ryu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/K._Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._W._Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/W._C._Lim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Y._J._Song>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Y._Ji>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Y._S._Han>
swrc:pages 1-5 (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2023.html#SatoSJLBKRLHJLKLLPSJSKK23>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48203.2023.10118152>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Comprehensive study on prediction of endurance properties from breakdown voltage in high-reliable STT-MRAM. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document