Comprehensive Analysis of Hole-Trapping in SiN Films with a Wide Range of Time Constants Based on Dynamic C-V.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/irps/SekiIHNSS23
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/irps/SekiIHNSS23
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Harumi_Seki
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Masamichi_Suzuki
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Masumi_Saitoh
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Reika_Ichihara
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yasushi_Nakasaki
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yusuke_Higashi
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10118083
>
foaf:
homepage
<
https://doi.org/10.1109/IRPS48203.2023.10118083
>
dc:
identifier
DBLP conf/irps/SekiIHNSS23
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FIRPS48203.2023.10118083
(xsd:string)
dcterms:
issued
2023
(xsd:gYear)
rdfs:
label
Comprehensive Analysis of Hole-Trapping in SiN Films with a Wide Range of Time Constants Based on Dynamic C-V.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Harumi_Seki
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Masamichi_Suzuki
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Masumi_Saitoh
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Reika_Ichihara
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yasushi_Nakasaki
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yusuke_Higashi
>
swrc:
pages
1-7
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/irps/2023
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/irps/SekiIHNSS23/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/irps/SekiIHNSS23
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/irps/irps2023.html#SekiIHNSS23
>
rdfs:
seeAlso
<
https://doi.org/10.1109/IRPS48203.2023.10118083
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/irps
>
dc:
title
Comprehensive Analysis of Hole-Trapping in SiN Films with a Wide Range of Time Constants Based on Dynamic C-V.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document