[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/SeoRLJCOBL23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eunsun_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hyewon_Seo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hyodong_Ban>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeonghoon_Oh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jooyoung_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kyosuk_Chae>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sekyoung_Jang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Taiuk_Rim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10117671>
foaf:homepage <https://doi.org/10.1109/IRPS48203.2023.10117671>
dc:identifier DBLP conf/irps/SeoRLJCOBL23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48203.2023.10117671 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Analysis of Intermittent Single-bit Failure on 10-nm node generation DRAM Devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eunsun_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hyewon_Seo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hyodong_Ban>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeonghoon_Oh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jooyoung_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kyosuk_Chae>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sekyoung_Jang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Taiuk_Rim>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/SeoRLJCOBL23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/SeoRLJCOBL23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2023.html#SeoRLJCOBL23>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48203.2023.10117671>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Analysis of Intermittent Single-bit Failure on 10-nm node generation DRAM Devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document