Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/irps/StoffelsPDBTSFZ19
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Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability.
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Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability.
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