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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/SunLXLWZJWH23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haoran_Lu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jiayang_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ru_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Runsheng_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wenpu_Luo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yongkang_Xue>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhigang_Ji>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zirui_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zixuan_Sun>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10117840>
foaf:homepage <https://doi.org/10.1109/IRPS48203.2023.10117840>
dc:identifier DBLP conf/irps/SunLXLWZJWH23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48203.2023.10117840 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haoran_Lu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jiayang_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ru_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Runsheng_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wenpu_Luo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yongkang_Xue>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhigang_Ji>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zirui_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zixuan_Sun>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/SunLXLWZJWH23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/SunLXLWZJWH23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2023.html#SunLXLWZJWH23>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48203.2023.10117840>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document