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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/TallaricoRDCSF20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andrea_Natale_Tallarico>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Claudio_Fiegna>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Enrico_Sangiorgi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giuseppe_Croce>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Riccardo_Depetro>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Susanna_Reggiani>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS45951.2020.9129112>
foaf:homepage <https://doi.org/10.1109/IRPS45951.2020.9129112>
dc:identifier DBLP conf/irps/TallaricoRDCSF20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS45951.2020.9129112 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Full Understanding of Hot Electrons and Hot/Cold Holes in the Degradation of p-channel Power LDMOS Transistors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andrea_Natale_Tallarico>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Claudio_Fiegna>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Enrico_Sangiorgi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giuseppe_Croce>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Riccardo_Depetro>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Susanna_Reggiani>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2020>
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rdfs:seeAlso <https://doi.org/10.1109/IRPS45951.2020.9129112>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Full Understanding of Hot Electrons and Hot/Cold Holes in the Degradation of p-channel Power LDMOS Transistors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document