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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/TyaginovMECBJVG22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adrian_Vaisman_Chasin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Al-Moatasem_Bellah_El-Sayed>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alexander_Grill>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alexander_Makarov>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/An_De_Keersgieter>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_Bury>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Geert_Eneman>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Markus_Jech>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michiel_Vandemaele>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mikhail_I._Vexler>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stanislav_Tyaginov>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48227.2022.9764515>
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dc:identifier DBLP conf/irps/TyaginovMECBJVG22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48227.2022.9764515 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adrian_Vaisman_Chasin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Al-Moatasem_Bellah_El-Sayed>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alexander_Grill>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alexander_Makarov>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/An_De_Keersgieter>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Markus_Jech>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michiel_Vandemaele>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mikhail_I._Vexler>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stanislav_Tyaginov>
swrc:pages 6 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/IRPS48227.2022.9764515>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document