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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/UemuraCJJJJRLRP20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Byungjin_Chung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Euncheol_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hai_Jiang_0005>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hwasung_Rhee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jaehee_Choi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeongmin_Jo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ken_Machida>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rakesh_Ranjan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sangwoo_Pae>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seungbae_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shota_Ohnishi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tae-Young_Jeong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Taiki_Uemura>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yongsung_Ji>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS45951.2020.9129331>
foaf:homepage <https://doi.org/10.1109/IRPS45951.2020.9129331>
dc:identifier DBLP conf/irps/UemuraCJJJJRLRP20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS45951.2020.9129331 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Byungjin_Chung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Euncheol_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hai_Jiang_0005>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hwasung_Rhee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jaehee_Choi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeongmin_Jo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ken_Machida>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rakesh_Ranjan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sangwoo_Pae>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seungbae_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shota_Ohnishi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tae-Young_Jeong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Taiki_Uemura>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yongsung_Ji>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/UemuraCJJJJRLRP20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/UemuraCJJJJRLRP20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2020.html#UemuraCJJJJRLRP20>
rdfs:seeAlso <https://doi.org/10.1109/IRPS45951.2020.9129331>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document