[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/VandemaeleKBFCMMHG23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adrian_Chasin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alexander_Makarov>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_Bury>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Geert_Hellings>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guido_Groeseneken>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans_Mertens>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jacopo_Franco>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michiel_Vandemaele>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10118211>
foaf:homepage <https://doi.org/10.1109/IRPS48203.2023.10118211>
dc:identifier DBLP conf/irps/VandemaeleKBFCMMHG23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48203.2023.10118211 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adrian_Chasin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alexander_Makarov>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erik_Bury>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Geert_Hellings>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guido_Groeseneken>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans_Mertens>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jacopo_Franco>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michiel_Vandemaele>
swrc:pages 1-10 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/VandemaeleKBFCMMHG23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/VandemaeleKBFCMMHG23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2023.html#VandemaeleKBFCMMHG23>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48203.2023.10118211>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document