[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/VandendaeleLLJVGMNCI23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Constant>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abyga%E2%88%9A%C4%99l_Viey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/B._Mohamad>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Camille_Leurquin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/E._Nowak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ferdinando_Iucolano>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marie-Anne_Jaud>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._Lavieville>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Romain_Gwoziecki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/William_Vandendaele>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10118180>
foaf:homepage <https://doi.org/10.1109/IRPS48203.2023.10118180>
dc:identifier DBLP conf/irps/VandendaeleLLJVGMNCI23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48203.2023.10118180 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Voltage Instabilities (Invited). (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Constant>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abyga%E2%88%9A%C4%99l_Viey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/B._Mohamad>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Camille_Leurquin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/E._Nowak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ferdinando_Iucolano>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marie-Anne_Jaud>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._Lavieville>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Romain_Gwoziecki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/William_Vandendaele>
swrc:pages 1-8 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/VandendaeleLLJVGMNCI23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/VandendaeleLLJVGMNCI23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2023.html#VandendaeleLLJVGMNCI23>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48203.2023.10118180>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Voltage Instabilities (Invited). (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document