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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/VyasPTABSLGI21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ali_B._Icel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Germain_Bossu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jung-Suk_Goo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mahesh_Siddabathula>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ninad_Pimparkar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pratik_B._Vyas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_Tu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Steffen_Lehmann>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wafa_Arfaoui>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS46558.2021.9405197>
foaf:homepage <https://doi.org/10.1109/IRPS46558.2021.9405197>
dc:identifier DBLP conf/irps/VyasPTABSLGI21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS46558.2021.9405197 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ali_B._Icel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Germain_Bossu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jung-Suk_Goo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mahesh_Siddabathula>
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Steffen_Lehmann>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wafa_Arfaoui>
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rdfs:seeAlso <https://doi.org/10.1109/IRPS46558.2021.9405197>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document