[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/WangLYSC15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chia-Yu_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_H._Stathis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Miaomiao_Wang_0006>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tenko_Yamashita>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zuoguang_Liu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS.2015.7112727>
foaf:homepage <https://doi.org/10.1109/IRPS.2015.7112727>
dc:identifier DBLP conf/irps/WangLYSC15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS.2015.7112727 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label Separation of interface states and electron trapping for hot carrier degradation in ultra-scaled replacement metal gate n-FinFET. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chia-Yu_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_H._Stathis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Miaomiao_Wang_0006>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tenko_Yamashita>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zuoguang_Liu>
swrc:pages 4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2015>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/WangLYSC15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/WangLYSC15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2015.html#WangLYSC15>
rdfs:seeAlso <https://doi.org/10.1109/IRPS.2015.7112727>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Separation of interface states and electron trapping for hot carrier degradation in ultra-scaled replacement metal gate n-FinFET. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document