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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/WielandOSBKSMRHNGPO23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andrea_Minetto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/B._Butej>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Koller>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Clemens_Ostermaier>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/D._Wieland>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dionyz_Pogany>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._Sun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/K._Reiser>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Stabentheiner>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Glavanovics>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Nelhiebel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Oliver_H%E2%88%9A%C2%A7berlen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Ofner>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10117943>
foaf:homepage <https://doi.org/10.1109/IRPS48203.2023.10117943>
dc:identifier DBLP conf/irps/WielandOSBKSMRHNGPO23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48203.2023.10117943 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andrea_Minetto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/B._Butej>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Koller>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Clemens_Ostermaier>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/D._Wieland>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dionyz_Pogany>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._Sun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/K._Reiser>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Stabentheiner>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Glavanovics>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Nelhiebel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Oliver_H%E2%88%9A%C2%A7berlen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Ofner>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/WielandOSBKSMRHNGPO23/dblp>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2023.html#WielandOSBKSMRHNGPO23>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48203.2023.10117943>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document