[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/WuMJHBSGDR15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Benoit_Bakeroot>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Brice_De_Jaeger>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Denis_Marcon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guido_Groeseneken>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marleen_Van_Hove>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robin_Roelofs>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefaan_Decoutere>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Steve_Stoffels>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tian-Li_Wu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS.2015.7112769>
foaf:homepage <https://doi.org/10.1109/IRPS.2015.7112769>
dc:identifier DBLP conf/irps/WuMJHBSGDR15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS.2015.7112769 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label Time dependent dielectric breakdown (TDDB) evaluation of PE-ALD SiN gate dielectrics on AlGaN/GaN recessed gate D-mode MIS-HEMTs and E-mode MIS-FETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Benoit_Bakeroot>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Brice_De_Jaeger>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Denis_Marcon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guido_Groeseneken>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marleen_Van_Hove>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robin_Roelofs>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefaan_Decoutere>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Steve_Stoffels>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tian-Li_Wu>
swrc:pages 6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2015>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/WuMJHBSGDR15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/WuMJHBSGDR15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2015.html#WuMJHBSGDR15>
rdfs:seeAlso <https://doi.org/10.1109/IRPS.2015.7112769>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Time dependent dielectric breakdown (TDDB) evaluation of PE-ALD SiN gate dielectrics on AlGaN/GaN recessed gate D-mode MIS-HEMTs and E-mode MIS-FETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document