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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/XiongFPBNBDWWFB22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alexandra_Feeley>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Balaji_Narasimham>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bharat_L._Bhuva>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dennis_R._Ball>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/John_Brockman>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/N._A._Dodds>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nicholas_J._Pieper>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rita_Fung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._A._Wender>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shi-Jie_Wen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoni_Xiong>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48227.2022.9764523>
foaf:homepage <https://doi.org/10.1109/IRPS48227.2022.9764523>
dc:identifier DBLP conf/irps/XiongFPBNBDWWFB22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48227.2022.9764523 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alexandra_Feeley>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Balaji_Narasimham>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bharat_L._Bhuva>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dennis_R._Ball>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/John_Brockman>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/N._A._Dodds>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nicholas_J._Pieper>
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._A._Wender>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shi-Jie_Wen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoni_Xiong>
swrc:pages 7 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/IRPS48227.2022.9764523>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document