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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/YoonLSKLKLPKP23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bokyoung_Kang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bumgi_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Doh-Soon_Kwak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Heonsang_Lim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ilsang_Park>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jaehee_Song>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jiyoung_Yoon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jonghoon_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sangho_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sangwoo_Pae>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS48203.2023.10117800>
foaf:homepage <https://doi.org/10.1109/IRPS48203.2023.10117800>
dc:identifier DBLP conf/irps/YoonLSKLKLPKP23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS48203.2023.10117800 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Customized wafer level verification methodology: quality risk pre-diagnosis with enhanced screen-ability of stand-by stress-related deteriorations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bokyoung_Kang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bumgi_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Doh-Soon_Kwak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Heonsang_Lim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ilsang_Park>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jaehee_Song>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jiyoung_Yoon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jonghoon_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sangho_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sangwoo_Pae>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/YoonLSKLKLPKP23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/YoonLSKLKLPKP23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2023.html#YoonLSKLKLPKP23>
rdfs:seeAlso <https://doi.org/10.1109/IRPS48203.2023.10117800>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Customized wafer level verification methodology: quality risk pre-diagnosis with enhanced screen-ability of stand-by stress-related deteriorations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document