Investigation of Channel Dimension Dependence of BTI Degradation and Variation in Planar HKMG MOSFET.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/irps/ZhangSGJYZH23
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Investigation of Channel Dimension Dependence of BTI Degradation and Variation in Planar HKMG MOSFET.
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Investigation of Channel Dimension Dependence of BTI Degradation and Variation in Planar HKMG MOSFET.
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