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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/ZhouZYJLZSYLDZW21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anyan_Du>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chao_Zhao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eddy_Simoen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hong_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Huaxiang_Yin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jun_Luo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Longda_Zhou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qianqian_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qingzhu_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wenwu_Wang_0006>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhaohao_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhigang_Ji>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS46558.2021.9405105>
foaf:homepage <https://doi.org/10.1109/IRPS46558.2021.9405105>
dc:identifier DBLP conf/irps/ZhouZYJLZSYLDZW21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS46558.2021.9405105 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/ AC NBTI Stress/Recovery Condition in Si p-FinFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anyan_Du>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chao_Zhao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eddy_Simoen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hong_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Huaxiang_Yin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jun_Luo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Longda_Zhou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qianqian_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qingzhu_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wenwu_Wang_0006>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhaohao_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhigang_Ji>
swrc:pages 1-7 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2021>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/ZhouZYJLZSYLDZW21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/ZhouZYJLZSYLDZW21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2021.html#ZhouZYJLZSYLDZW21>
rdfs:seeAlso <https://doi.org/10.1109/IRPS46558.2021.9405105>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/ AC NBTI Stress/Recovery Condition in Si p-FinFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document