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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/irps/ZhouZYJZXYW20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hong_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Huaxiang_Yin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Longda_Zhou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qingzhu_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Renren_Xu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wenwu_Wang_0006>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhaohao_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhigang_Ji>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIRPS45951.2020.9129562>
foaf:homepage <https://doi.org/10.1109/IRPS45951.2020.9129562>
dc:identifier DBLP conf/irps/ZhouZYJZXYW20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIRPS45951.2020.9129562 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hong_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Huaxiang_Yin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Longda_Zhou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qingzhu_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Renren_Xu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wenwu_Wang_0006>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhaohao_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhigang_Ji>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/irps/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/irps/ZhouZYJZXYW20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/irps/ZhouZYJZXYW20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/irps/irps2020.html#ZhouZYJZXYW20>
rdfs:seeAlso <https://doi.org/10.1109/IRPS45951.2020.9129562>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/irps>
dc:title Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document