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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iscas/AkyelCTPKFLG13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bertrand_Pelloux-Prayer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christophe_Lecocq>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/G%E2%88%9A%C2%A9rard_Ghibaudo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaya_Can_Akyel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lorenzo_Ciampolini>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Olivier_Thomas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Philippe_Flatresse>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shishir_Kumar>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISCAS.2013.6572130>
foaf:homepage <https://doi.org/10.1109/ISCAS.2013.6572130>
dc:identifier DBLP conf/iscas/AkyelCTPKFLG13 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISCAS.2013.6572130 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
rdfs:label Multiple-pulse dynamic stability and failure analysis of low-voltage 6T-SRAM bitcells in 28nm UTBB-FDSOI. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bertrand_Pelloux-Prayer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christophe_Lecocq>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/G%E2%88%9A%C2%A9rard_Ghibaudo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaya_Can_Akyel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lorenzo_Ciampolini>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Olivier_Thomas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Philippe_Flatresse>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shishir_Kumar>
swrc:pages 1452-1455 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iscas/2013>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iscas/AkyelCTPKFLG13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iscas/AkyelCTPKFLG13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iscas/iscas2013.html#AkyelCTPKFLG13>
rdfs:seeAlso <https://doi.org/10.1109/ISCAS.2013.6572130>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iscas>
dc:title Multiple-pulse dynamic stability and failure analysis of low-voltage 6T-SRAM bitcells in 28nm UTBB-FDSOI. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document