[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iscas/ChenXDD23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Li_Du>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yang_Xiao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuan_Du>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhichao_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISCAS46773.2023.10182219>
foaf:homepage <https://doi.org/10.1109/ISCAS46773.2023.10182219>
dc:identifier DBLP conf/iscas/ChenXDD23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISCAS46773.2023.10182219 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Characterization of Charge-Trap-Transistor (CTT) Threshold Voltage Degradation and Differential-Pair-Based Memory Design. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Li_Du>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yang_Xiao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuan_Du>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhichao_Chen>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iscas/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iscas/ChenXDD23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iscas/ChenXDD23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iscas/iscas2023.html#ChenXDD23>
rdfs:seeAlso <https://doi.org/10.1109/ISCAS46773.2023.10182219>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iscas>
dc:title Characterization of Charge-Trap-Transistor (CTT) Threshold Voltage Degradation and Differential-Pair-Based Memory Design. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document