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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iscas/EsonuAR93>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C%E2%88%9A%C4%ABme_Rozon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dhamin_Al-Khalili>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Ogbonna_Esonu>
dc:identifier DBLP conf/iscas/EsonuAR93 (xsd:string)
dcterms:issued 1993 (xsd:gYear)
rdfs:label Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C%E2%88%9A%C4%ABme_Rozon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dhamin_Al-Khalili>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Ogbonna_Esonu>
swrc:pages 1714-1717 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iscas/1993>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iscas/EsonuAR93/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iscas/EsonuAR93>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iscas/iscas1993-3.html#EsonuAR93>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iscas>
dc:title Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document