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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iscas/HarabechBCPS00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jean-Pierre_Sorbier>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nadia_Harabech>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Philippe_Pannier>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pierre_Canet>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rachid_Bouchakour>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISCAS.2000.856359>
foaf:homepage <https://doi.org/10.1109/ISCAS.2000.856359>
dc:identifier DBLP conf/iscas/HarabechBCPS00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISCAS.2000.856359 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Extraction of Fowler-Nordheim parameters of thin SiO2 oxide film including polysilicon gate depletion: validation with an EEPROM memory cell. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jean-Pierre_Sorbier>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nadia_Harabech>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Philippe_Pannier>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pierre_Canet>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rachid_Bouchakour>
swrc:pages 441-444 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iscas/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iscas/HarabechBCPS00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iscas/HarabechBCPS00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iscas/iscas2000.html#HarabechBCPS00>
rdfs:seeAlso <https://doi.org/10.1109/ISCAS.2000.856359>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iscas>
dc:title Extraction of Fowler-Nordheim parameters of thin SiO2 oxide film including polysilicon gate depletion: validation with an EEPROM memory cell. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document