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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iscas/HashizumeIYT05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Yotsuyanagi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masahiro_Ichimiya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masaki_Hashizume>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takeomi_Tamesada>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISCAS.2005.1465257>
foaf:homepage <https://doi.org/10.1109/ISCAS.2005.1465257>
dc:identifier DBLP conf/iscas/HashizumeIYT05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISCAS.2005.1465257 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Electric field for detecting open leads in CMOS logic circuits by supply current testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Yotsuyanagi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masahiro_Ichimiya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masaki_Hashizume>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takeomi_Tamesada>
swrc:pages 2995-2998 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iscas/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iscas/HashizumeIYT05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iscas/HashizumeIYT05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iscas/iscas2005-3.html#HashizumeIYT05>
rdfs:seeAlso <https://doi.org/10.1109/ISCAS.2005.1465257>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iscas>
dc:title Electric field for detecting open leads in CMOS logic circuits by supply current testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document